Dataset Restricted Access
Bonnerot, Olivier;
Shevchuk, Ivan;
Rabin, Ira
Bonnerot, Olivier
Shevchuk, Ivan;
Rabin, Ira;
Helou, Kasser
XRF (Elio: 40kV, 20 µA, spot measurements of 30-60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of pigments from miniatures of BNF Ms Fr9084 from the Bibliothèque nationale de France (France).
Analysis of 8 folios
MSI was also performed to recover damaged writing. Link to dataset is included in related identifier.
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