Dataset Restricted Access
Bonnerot, Olivier;
Nehring, Grzegorz
Bonnerot, Olivier
Rabin, Ira;
Martini, Annett
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis of inks from Ms. or. fol. 1212 (Erfurt 2).
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