Dataset Open Access
Bonnerot, Olivier;
Maksimczuk, José
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Universitaetsbibliothek Leipzig Ms. Rep. I 68a.
Name | Size | |
---|---|---|
RepI68a_Protocols.zip
md5:8c244e869a3ae7e1d4a33516afb83117 |
67.2 MB | Download |
RepI68a_reflectography.zip
md5:0631d27f79c49c903532af8a1e1116a5 |
42.9 MB | Download |
RepI68a_XRF.zip
md5:65b8daf4e4f027188c3c5d9b42cceade |
595.4 kB | Download |
Report_Leipzig.docx
md5:3274b1563128a361e61a2a87ada952da |
146.3 kB | Download |