Dataset Open Access
Bonnerot, Olivier
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran charters kept at the Bayerisches Hauptstaatsarchiv (München) (9th-12th century CE).
| Name | Size | |
|---|---|---|
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Emmeran charters_reflectography.zip
md5:d9daccaa0b45ee333fe8b64f5388e802 |
78.6 MB | Download |
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Emmeran charters_XRF.zip
md5:7ec7fa2b5244e86bc59e6e11fecf7c8d |
1.5 MB | Download |
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Messpunkte Emmeram.docx
md5:608e932dc1bb7f9a28aaf6389e618bd5 |
95.8 kB | Download |
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Protocols Emmeran 2.pptx
md5:8e4aab4b9838e6bebaf9bf296b34c2fd |
27.0 MB | Download |
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Protocols Emmeran.pptx
md5:da5aa34117bf6c4dff1affe9afdd3ef9 |
47.1 MB | Download |
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Report_Emmeran Charters.docx
md5:d6249b2775219125d19fe36b3e7b5930 |
154.3 kB | Download |