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X-Ray Fluorescence and Reflectography Data from Munich, Bayerisches Hauptstaatsarchiv (München) Emmeran charters

Bonnerot, Olivier

Contact person(s)
Bonnerot, Olivier
Researcher(s)
Hennings, Till

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran charters kept at the Bayerisches Hauptstaatsarchiv (München) (9th-12th century CE).

  1. Emmeran charters_reflectography.zip - complete reflectography dataset
  2. Emmeran charters_XRF.zip - complete XRF dataset
  3. Messpunkte Emmeram.docx - list of spots analysed (in German)
  4. Protocols Staatsarchiv München.pptx - Protocol (part 1/2)
  5. Protocols Staatsarchiv München2.pptx - Protocol (part 2/2)
  6. Report_Emmeran Charters.docx - detailed report

The research for this dataset was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under Germany's Excellence Strategy – EXC 2176 'Understanding Written Artefacts: Material, Interaction and Transmission in Manuscript Cultures', project no. 390893796. The research was conducted within the scope of the Centre for the Study of Manuscript Cultures (CSMC) at Universität Hamburg.
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