Dataset Restricted Access
Bonnerot, Olivier
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran charters kept at the Bayerisches Hauptstaatsarchiv (München) (9th-12th century CE).
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