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X-Ray Fluorescence and Reflectography Data from Munich, Bayerisches Hauptstaatsarchiv (München) Emmeran charters

Bonnerot, Olivier


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{"DOI":"10.25592/uhhfdm.11173","abstract":"<p>XRF (Elio: 40kV, 80 &micro;A, spot measurements of 120s each) and&nbsp; reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran charters kept at the Bayerisches Hauptstaatsarchiv (M&uuml;nchen) (9th-12th century CE).</p>\n\n<ol>\n\t<li>Emmeran charters_reflectography.zip - complete reflectography dataset</li>\n\t<li>Emmeran charters_XRF.zip - complete XRF dataset</li>\n\t<li>Messpunkte Emmeram.docx - list of spots analysed (in German)</li>\n\t<li>Protocols Staatsarchiv M&uuml;nchen.pptx - Protocol (part 1/2)</li>\n\t<li>Protocols Staatsarchiv M&uuml;nchen2.pptx - Protocol (part 2/2)</li>\n\t<li>Report_Emmeran Charters.docx - detailed report</li>\n</ol>","author":[{"family":"Bonnerot, Olivier"}],"id":"11173","issued":{"date-parts":[[2022,12,8]]},"language":"eng","note":"The research for this dataset was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under Germany's Excellence Strategy \u2013 EXC 2176 'Understanding Written Artefacts: Material, Interaction and Transmission in Manuscript Cultures', project no. 390893796. The research was conducted within the scope of the Centre for the Study of Manuscript Cultures (CSMC) at Universit\u00e4t Hamburg.","title":"X-Ray Fluorescence and Reflectography Data from Munich, Bayerisches Hauptstaatsarchiv (M\u00fcnchen) Emmeran charters","type":"dataset"}

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